Effect of Days to Fruit Maturity and Post-Harvest Ripening of Fruit on Seed Yield and Quality in Pumpkin

Sushil Pattar *

ICAR-National Institute of Seed Science and Technology, Mau-275101, Uttar Pradesh, India.

Kalyanrao Patil

ICAR-National Institute of Seed Science and Technology, Mau-275101, Uttar Pradesh, India.

M. M. Pandya

Main Vegetable Research Station, Anand Agricultural University, Anand, India.

N. A. Patel

Main Vegetable Research Station, Anand Agricultural University, Anand, India.

Prity Kumari

College of Horticulture, Anand Agricultural University, Anand, India.

*Author to whom correspondence should be addressed.


Abstract

Aims: The study aims to show the effect of stage of fruit harvesting and post harvest ripening of fruit and the combination of both the factors on fruit parameters as well as seed parameters in pumpkin.

Study Design: Experiment was conducted using FRCBD (Factorial Randomized Complete Block Design).

Place and Duration of Study: Department of Seed Science and Technology, B. A. College of Agriculture, Anand Agricultural University, Anand, between September 2024 and April 2025.

Methodology: This experiment was conducted, where pumpkin fruits were subjected to 3 levels of factor A that is days to fruit maturity and 4 levels of factor B that is post harvest ripening of fruit, factor A  included (D1) 50 DAA (Days After Anthesis), (D2) 60 DAA and (D3)70 DAA and factor B included (B1) 0 PHR (Post Harvest Ripening), (B2) 10 PHR, (B3) 20 PHR and (B4) 30 PHR.

Results: With respect to fruit parameters pumpkin fruits harvested at 70 DAA (D3) recorded highest fruit parameters such as fruit weight (8.18 kg), fruit length (19.17 cm), fruit diameter (26.13 cm), cavity length (12.3 cm) and flesh thickness (4.65 cm). With respect to seed quality parameters D3B4 that is fruits harvested at 70 DAA and subjected to a ripening period of 30 days PHR recorded highest number of filled seed per fruit of 120.27, effect was found non significant for number of unfillrd seed per fruit, D2B3 that is fruits harvested at 60 DAA and subjected to a ripening period of 20 days PHR recorded highest seed weight  per fruit of 26.49 g, D2B3 that is fruits harvested at 60 DAA and subjected to a ripening period of 20 days PHR recorded highest 100 seed weight  per fruit of 25.75 g, D3B4 that is fruits harvested at 70 DAA and subjected to a ripening period of 30 days PHR recorded highest germination % of 86.66, D2B4 that is fruits harvested at 60 DAA and subjected to a ripening period of 30 days PHR recorded highest seedling length of 43.50 cm, D3B3 that is fruits harvested at 70 DAA and subjected to a ripening period of 20 days PHR recorded highest seedling dry weight of 1.55 g, D2B2 that is fruits harvested at 60 DAA and subjected to a ripening period of 10 days PHR recorded highest seedling vigour index Ⅰ of 3389, D3B3 that is fruits harvested at 70 DAA and subjected to a ripening period of 20 days PHR recorded highest seedling vigour index Ⅱ of 123.53, effect was found non significant for moisture % and D1B1 that is fruits harvested at 50 DAA and subjected to a ripening period of 0 days PHR recorded highest EC of 0.77.  

Conclusion: The study demonstrated that the pumpkin fruits subjected to factor A that is 60 & 70 days after anthesis (DAA), factor B that is post harvest ripening period (PHR) of 10, 20 & 30 days recorded highest fruit and seed quality parameters, the present investigation is aimed at addressing the effects of fruit maturity and post-harvest ripening of fruit on seed yield and quality. These insights can contribute to more efficient and productive pumpkin seed production systems, ultimately benefiting growers and the vegetable seed industry.

Keywords: Pumpkin, days after anthesis, post harvest ripening, seed quality, yield


How to Cite

Pattar, Sushil, Kalyanrao Patil, M. M. Pandya, N. A. Patel, and Prity Kumari. 2025. “Effect of Days to Fruit Maturity and Post-Harvest Ripening of Fruit on Seed Yield and Quality in Pumpkin”. Journal of Experimental Agriculture International 47 (7):635-41. https://doi.org/10.9734/jeai/2025/v47i73603.

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